IEEE/ACM International Symposium on Microarchitecture^®

Website: https://www.microarch.org/tot/

The MICRO Test of Time (ToT) Award Committee is pleased to announce that three papers have been selected for the 2018 MICRO Test of Time award. The three winners, in no particular order, are:

• DIVA: A Reliable Substrate for Deep Submicron Microarchitecture Design
  Todd M. Austin
• Efficient Path Profiling
  Thomas Ball, James R. Larus
• Assigning Confidence to Conditional Branch Predictors
  Erik Jacobsen, Eric Rotenberg, James E. Smith

The three papers were selected from among 149 eligible papers published in MICRO conferences that were held between 1996 and 2000 (inclusive). The winners were announced at the awards luncheon at MICRO 2018 in Fukuoka, Japan. Selected comments from the winners are available as part of the award presentation slides.

For more information about the award, the nomination and selection process, and a list of prior winners, please visit the Test of Time Award website.